Abstract
Germanium antimony (Ge:Sb) thin films have been fabricated by thermal evaporation system deposition at atmospheric pressure between (5.8x10-6to 7.5x10-6) mbar. The (Ge:Sb) thin films then exposure to Nd:YAGlaser with 1064μm wavelength at different energy densities (100,200) mj/cm2. XRD analysis show that Germanium antimony thin films are polycrystalline and the full width at half maximum(FWHM)increase as laser energy densitiesincreases. Photocurrent and quantum efficiency of the detector increases as the laser energy densitiesincreases
Keywords
Antimony
Germanium
Nd:Yag laser
thin films